| Item | Unit | Specification | |
|---|---|---|---|
| Type | P-type/N-type | ||
| Crystal Growth Method | VGF | VGF | |
| Dopant | Fe | S, Sn, Zn, Undoped | |
| Diameter | inch | 2-4 | 2-4 |
| Surface Orientation | (100) ± 0.5° | (100) ± 0.5° | |
| Oriflame Orientation | US, EJ | US, EJ | |
| Resistivity | Ω·cm | ≥0.5 × 107 | |
| Carrier Concentration | cm-3 | N/A | (0.8-8) × 1018/(1-10) × 1015/(0.8-8) × 1018 |
| Electron Mobility (Mob) | cm2/v.s | ≥1000 | 1000-2500/3000-5000/50-100 |
| Dislocation Density (EPD) | cm2 | 1500-5000 | 100-5000/≥5000/≥500 |
| Thickness | μm | (350-675) ± 25 | (350-675) ± 25 |
| TTV (P/P) | μm | ≤10 | ≤10 |
| TTV (P/E) | μm | ≤15 | ≤15 |
| Warp | μm | ≤15 | ≤15 |
| Surface Finishing | Sides 1 & 2 | Mirror/Etching | |
| Packing Method | Coin Roll/Cassette Case | Coin Roll/Cassette Case | |
| Specification | Size | 2", 3", 4" | ||
|---|---|---|---|---|
| Epitaxial Materials | InP, InAlAs, InGaAs | |||
| Doping | Si (N Type) / Be (P Type) | |||
| Wavelength | Conventional 0.9~1.7 μm | Extended 1.0~2.5 μm | ||
| Structure | Planar Type | Layer | Doping (cm3) | Thickness (nm) |
| n-InyAl1-yAs Cap | 1-5×1016 | 500-1000 | ||
| i-InGaAs Absorber | uid | 1500-3000 | ||
| n+-InxAl1-xAs Buffer | 1-5×1018 | 1000-2000 | ||
| InP Buffer | 1-5×1018 | 200-1000 | ||
| InP | — | / | ||
| Mesa Type | p-InyAl1-yAs Cap | 1-5×1018 | 500-1000 | |
| i-InGaAs Absorber | uid | 1500-3000 | ||
| n+-InxAl1-xAs Buffer | 1-5×1018 | 1000-2000 | ||
| InP Buffer | 1-5×1018 | 200-1000 | ||
| InP | — | / | ||
We can provide epitaxial wafers with customized sizes and thicknesses.
Selected parameters can be tailored to meet customer requirements.
| Product Specification | Size | 2", 3", 4" | |
|---|---|---|---|
| Epitaxial Materials | InP, InGaAs, InGaAsP, InAIAs | ||
| Doping | Si (N Type) | ||
| Product Structure ① | Layer | Doping (cm3) | Thickness (nm) |
| InP | uid | 2500-4000 | |
| InP | 1-5×1017 | 200-1000 | |
| InGaAsP | uid | 10-500 | |
| InGaAs | uid | 1500-3000 | |
| InP Buffer | 1-5×1018 | 200-1000 | |
| InP | — | / | |
| Product Structure ② | Layer | Doping (cm3) | Thickness (nm) |
| InP | uid | 500-4000 | |
| InAlAs | 1-5×1017 | 200-1000 | |
| InAlAs | uid | 10-500 | |
| InGaAs | uid | 1500-3000 | |
| InAIAs | 1-5×1018 | 200-1000 | |
| InP Buffer | 1-5×1018 | 200-1000 | |
| InP | — | / | |
We can provide epitaxial wafers with customized sizes and thicknesses.
Selected parameters can be tailored to meet customer requirements.
| Product Specification | Size | 2", 3" | |
|---|---|---|---|
| Epitaxial Materials | InAs, GaSb | ||
| Doping | Si (N Type) / Be (P Type) /Te (N Type) | ||
| Product Structure ① | Layer | Doping (cm3) | Thickness (nm) |
| n-InAs | 1-5×1018 | 10-100 | |
| n-InAs/GaSb | 1-5×1018 | 200-800 | |
| i-InAs/GaSb | uid | 1500-4000 | |
| p-InAs/GaSb | 1-5×1018 | 200-800 | |
| p-GaSb buffer | 1-5×1018 | 200-1000 | |
| GaSb | — | / | |
| Product Structure ② | Layer | Doping (cm3) | Thickness (nm) |
| p-GaSb | 1-5×1018 | 500-1000 | |
| p-InAs/GaSb (LW) | 1-5×1018 | 200-800 | |
| i-InAs/GaSb (LW) | uid | 1500-4000 | |
| n-GaSb | 1-5×1018 | 200-800 | |
| i-InAs/GaSb (MW) | uid | 1500-4000 | |
| p-InAs/GaSb (MW) | 1-5×1018 | 200-800 | |
| p-GaSb buffer | 1-5×1018 | 200-1000 | |
| GaSb | — | / | |
We can provide epitaxial wafers with customized sizes and thicknesses.
Selected parameters can be tailored to meet customer requirements.