Lithium Tantalate (LiTaO3)
Lithium Tantalate (LiTaO3) is an artificial monocrystalline material widely used in optics, electronics, and acoustics. It is particularly notable for its excellent nonlinear optical and piezoelectric properties, making it a key material for various advanced technologies. While it has properties similar to Lithium Niobate (LiNbO₃), it exhibits superior thermal and mechanical stability, making it a suitable alternative material for applications requiring harsh environments or high precision.
We provide Lithium Tantalate (LiTaO3) monocrystalline products.
2 to 6 inches
3mm × 3mm to 20mm × 20mm
Others
Optical Grade LiTaO3 Substrate/Wafer
| Material | LiTaO3 wafers (White or Black) | |
|---|---|---|
| Curie Temp | 603 ± 2℃ | |
| Cutting Angle | X/Y/Z etc | |
| Diameter/Size | 2”/3”/4” LT wafer | |
| Tol (±) | <0.20 mm | |
| Thickness | 0.18 ~ 0.5mm or more | |
| Primary Flat | 16 mm / 22 mm / 32 mm | |
| TTV | <3 µm | |
| Warp | <40 µm | |
| Surface Type | Single Side Polished /Double Sides Polished | |
| Polished Side Ra | <0.5 nm | |
| Back Side Criteria | General is 0.2-0.5µm or as customized | |
| Edge Criteria | R = 0.2mm or Bullnose | |
| Optical Doped | Zn/MgO etc | |
| Wafer Surface Criteria | Contamination | None |
| Particles >0.3 µm | <= 30 | |
| Scratch, Chipping | None | |
| Defect | No edge cracks, scratches, saw marks, stains | |
| Packaging | Qty/Wafer box | 25pcs per box |
SAW Grade LiTaO3 Substrate/Wafer
| Material | LiTaO3 wafers (White or Black) | |
|---|---|---|
| Curie Temp | 603 ± 2℃ | |
| Cutting Angle | X/Y/Z/X112Y/Y36/Y42/Y48/etc | |
| Diameter/Size | 3”/4”/6" LT Wafer | |
| Tol (±) | <0.20 mm | |
| Thickness | 0.18 ~ 0.5mm or more | |
| Primary Flat | 22 mm / 32 mm / 42.5 mm /57.5 mm | |
| LTV (5 mm × 5 mm) | <1 µm | |
| TTV | <3 µm | |
| Bow | -30 < bow < 30 | |
| Warp (<0.5 µm) | <40 µm | |
| PLTV (<0.5 µm) | ≥95% (5 mm × 5 mm) | |
| Orientation Flat | All Available | |
| Surface Type | Single Side Polished / Double Sides Polished | |
| Polished Side Ra | <0.5 nm | |
| Back Side Criteria | General is 0.2-0.5 µm or as customized | |
| Edge Criteria | R = 0.2 mm or Bullnose | |
| Wafer Surface Criteria | Transmissivity | general: 5.9 × 10-11 < s < 2.0 × 10-10 at 25℃ |
| Contamination | None | |
| Particles >0.3 µm | <= 30 | |
| Scratch, Chipping | None | |
| Defect | No edge cracks, scratches, saw marks, stains | |
| Packaging | Qty/Wafer box | 25pcs per box |