Silicon Nitride Powder (Si3N4)

Silicon Nitride Powder (chemical formula Si3N4) is an inorganic compound made from silicon and nitrogen. It is a ceramic material with particularly excellent mechanical, thermal, and chemical properties.

Features

High Strength & High Hardness
Silicon nitride is extremely hard and has excellent wear resistance.
Heat Resistance
It can maintain its mechanical properties even at high temperatures, therefore it is used as a heat-resistant material.
Lightweight
Due to its low specific gravity, it is gaining attention as a lightweight and resilient material.
Corrosion Resistance
It is resistant to acids and alkalis, and has high chemical stability.
Low Thermal Expansion Coefficient
It has little thermal expansion and strong resistance to thermal shock.

General Uses

CF-1A High Purity Silicon Nitride Powder

Test item Unit Index range Testing equipment or method
a phase % ≥93 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤1500 Atomic absorption method
ISO10058-3:2008
AI ppm ≤900
Ca ppm ≤900
N % ≥38 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.4 Gas volumetric method
GB/T 16555-2017
C % ≤0.15 High frequency infrared carbon analyzer
GB/T 16555-2017
D50 μm ≤0.75 Laser particle size analyzer
GB/T 19077-2016
O % ≤2.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017

CF-B High Purity Silicon Nitride Powder

Test item Unit Index range Testing equipment or method
a phase % ≥90 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤1800 Atomic absorption method
ISO10058-3:2008
AI ppm ≤900
Ca ppm ≤900
N % ≥37.5 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.2 Gas volumetric method
GB/T 16555-2017
C % ≤0.15 High frequency infrared carbon analyzer
GB/T 16555-2017
D50 μm ≤0.68 Laser particle size analyzer
GB/T 19077-2016
O % ≤3.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017

CF-HJ High Purity Silicon Nitride Powder

Test item Unit Index range Testing equipment or method
a phase % ≥90 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤200 Atomic absorption method
ISO10058-3:2008
AI ppm ≤200
Ca ppm ≤200
N % ≥38.5 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.2 Gas volumetric method
GB/T 16555-2017
C % ≤0.1 High frequency infrared carbon analyzer
GB/T 16555-2017
O % ≤1.4 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017
D50 μm ≤0.9 Laser particle size analyzer
GB/T 19077-2016

CF-HQ High Purity Silicon Nitride Powder

Test item Unit Index range Testing equipment or method
a phase % ≥93 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤500 Atomic absorption method
ISO10058-3:2008
AI ppm ≤300
Ca ppm ≤300
N % ≥38.5 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.3 Gas volumetric method
GB/T 16555-2017
C % ≤0.12 High frequency infrared carbon analyzer
GB/T 16555-2017
O % ≤1.5 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017
D50 μm ≤0.9 Laser particle size analyzer
GB/T 19077-2016

CF-K High Purity Silicon Nitride Powder

Test item Unit Index range Testing equipment or method
a phase % ≥20 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤5000 Atomic absorption method
ISO10058-3:2008
AI ppm ≤2500
Ca ppm ≤2500
N % ≥38 Kjeldahl nitrogen apparatus
GB/T 16555-2017
C % 0.15 High frequency infrared carbon analyzer
GB/T 16555-2017
O % <1.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017
D50 μm 5-10 Laser particle size analyzer
GB/T 19077-2016

CF-SN High Purity Silicon Nitride Powder

Test item Unit Index range Testing equipment or method
Fe ppm ≤5 ICP-OES
GB/T 30902-2014
AI ppm ≤5
Ca ppm ≤5
Mn ppm ≤5
Cu ppm ≤5
N % >39 Kjeldahl nitrogen apparatus
GB/T 16555-2017
C % ≤0.2 High frequency infrared carbon analyzer
GB/T 16555-2017
D50 μm 2 Laser particle size analyzer
GB/T 19077-2016
O % ≤1.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017