Silicon Nitride Powder (chemical formula Si3N4) is an inorganic compound made from silicon and nitrogen. It is a ceramic material with particularly excellent mechanical, thermal, and chemical properties.
Test item | Unit | Index range | Testing equipment or method |
---|---|---|---|
a phase | % | ≥93 | X-ray diffractometer JC/T 2342-2015 |
Fe | ppm | ≤1500 | Atomic absorption method ISO10058-3:2008 |
AI | ppm | ≤900 | |
Ca | ppm | ≤900 | |
N | % | ≥38 | Kjeldahl nitrogen apparatus GB/T 16555-2017 |
Free Si | % | <0.4 | Gas volumetric method GB/T 16555-2017 |
C | % | ≤0.15 | High frequency infrared carbon analyzer GB/T 16555-2017 |
D50 | μm | ≤0.75 | Laser particle size analyzer GB/T 19077-2016 |
O | % | ≤2.0 | Inertgas pulse infrared thermal conductivity method GB/T 16555-2017 |
Test item | Unit | Index range | Testing equipment or method |
---|---|---|---|
a phase | % | ≥90 | X-ray diffractometer JC/T 2342-2015 |
Fe | ppm | ≤1800 | Atomic absorption method ISO10058-3:2008 |
AI | ppm | ≤900 | |
Ca | ppm | ≤900 | |
N | % | ≥37.5 | Kjeldahl nitrogen apparatus GB/T 16555-2017 |
Free Si | % | <0.2 | Gas volumetric method GB/T 16555-2017 |
C | % | ≤0.15 | High frequency infrared carbon analyzer GB/T 16555-2017 |
D50 | μm | ≤0.68 | Laser particle size analyzer GB/T 19077-2016 |
O | % | ≤3.0 | Inertgas pulse infrared thermal conductivity method GB/T 16555-2017 |
Test item | Unit | Index range | Testing equipment or method |
---|---|---|---|
a phase | % | ≥90 | X-ray diffractometer JC/T 2342-2015 |
Fe | ppm | ≤200 | Atomic absorption method ISO10058-3:2008 |
AI | ppm | ≤200 | |
Ca | ppm | ≤200 | |
N | % | ≥38.5 | Kjeldahl nitrogen apparatus GB/T 16555-2017 |
Free Si | % | <0.2 | Gas volumetric method GB/T 16555-2017 |
C | % | ≤0.1 | High frequency infrared carbon analyzer GB/T 16555-2017 |
O | % | ≤1.4 | Inertgas pulse infrared thermal conductivity method GB/T 16555-2017 |
D50 | μm | ≤0.9 | Laser particle size analyzer GB/T 19077-2016 |
Test item | Unit | Index range | Testing equipment or method |
---|---|---|---|
a phase | % | ≥93 | X-ray diffractometer JC/T 2342-2015 |
Fe | ppm | ≤500 | Atomic absorption method ISO10058-3:2008 |
AI | ppm | ≤300 | |
Ca | ppm | ≤300 | |
N | % | ≥38.5 | Kjeldahl nitrogen apparatus GB/T 16555-2017 |
Free Si | % | <0.3 | Gas volumetric method GB/T 16555-2017 |
C | % | ≤0.12 | High frequency infrared carbon analyzer GB/T 16555-2017 |
O | % | ≤1.5 | Inertgas pulse infrared thermal conductivity method GB/T 16555-2017 |
D50 | μm | ≤0.9 | Laser particle size analyzer GB/T 19077-2016 |
Test item | Unit | Index range | Testing equipment or method |
---|---|---|---|
a phase | % | ≥20 | X-ray diffractometer JC/T 2342-2015 |
Fe | ppm | ≤5000 | Atomic absorption method ISO10058-3:2008 |
AI | ppm | ≤2500 | |
Ca | ppm | ≤2500 | |
N | % | ≥38 | Kjeldahl nitrogen apparatus GB/T 16555-2017 |
C | % | 0.15 | High frequency infrared carbon analyzer GB/T 16555-2017 |
O | % | <1.0 | Inertgas pulse infrared thermal conductivity method GB/T 16555-2017 |
D50 | μm | 5-10 | Laser particle size analyzer GB/T 19077-2016 |
Test item | Unit | Index range | Testing equipment or method |
---|---|---|---|
Fe | ppm | ≤5 | ICP-OES GB/T 30902-2014 |
AI | ppm | ≤5 | |
Ca | ppm | ≤5 | |
Mn | ppm | ≤5 | |
Cu | ppm | ≤5 | |
N | % | >39 | Kjeldahl nitrogen apparatus GB/T 16555-2017 |
C | % | ≤0.2 | High frequency infrared carbon analyzer GB/T 16555-2017 |
D50 | μm | 2 | Laser particle size analyzer GB/T 19077-2016 |
O | % | ≤1.0 | Inertgas pulse infrared thermal conductivity method GB/T 16555-2017 |