Quartz Wafer

Applications:
TGV, DOE, PLC, AWG, and other substrates
Features:
Extremely low metal impurity content
High refractive index uniformity
Bubble-free
High surface gloss and smoothness
OH content < 50 ppm
TW Series TW-1804 TW-1806 TW-1808 TW-1812
Size inch 4 6 8 12
Thickness (mm) 0.05～2 0.25～5 0.3～5 0.4～5
Tolerance Diameter (mm) ±0.1 ±0.1 ±0.1 ±0.1
Thickness (mm) Custom support Custom support Custom support Custom support
Optical Properties Refractive index n@365nm 1.474698 1.474698 1.474698 1.474698
Refractive index n@546.1nm 1.460243 1.460243 1.460243 1.460243
Refractive index n@1014nm 1.450423 1.450423 1.450423 1.450423
Internal transmittance (1250–1650 nm) >99.9% >99.9% >99.9% >99.9%
Transmittance (1250–1650 nm) >92% >92% >92% >92%
Processing Accuracy TTV(um) <3 <3 <3 <3
Flatness(um) ≤15 ≤15 ≤15 ≤15
Roughness(nm) ≤1 ≤1 ≤1 ≤1
Bow(um) <5 <5 <5 <5
Mechanical Properties Density(g/cm3) 2.2 2.2 2.2 2.2
Mohs Hardness 6～7 6～7 6～7 6～7
Young's modulus (GPa) 74.2 74.2 74.2 74.2
Shear modulus (GPa) 31.22 31.22 31.22 31.22
Poisson's ratio 0.17 0.17 0.17 0.17
Compressive strength (GPa) 1.13 1.13 1.13 1.13
Tensile strength (MPa) 49 49 49 49
Flexural strength (MPa) 94.3 94.3 94.3 94.3
Thermal Properties Yield Point
(η=1014.5dPa·s)		 1000℃ 1000℃ 1000℃ 1000℃
Annealing Point
(η=1013dPa·s)		 1160℃ 1160℃ 1160℃ 1160℃
Softening Point
(η=107.6dPa·s)		 1620℃ 1620℃ 1620℃ 1620℃
Purity Analysis Example
Content (ppm, wt%) Li Na K Mg Ca Cu Al Cr Fe Ti OH
TW Series <0.001 <0.005 <0.005 <0.005 <0.005 <0.001 <0.005 <0.001 <0.002 <0.008 <50