窒化ケイ素粉末(Si3N4

窒化ケイ素粉末(ちっかケイそふんまつ、Silicon Nitride Powder、化学式 Si3N4)は、ケイ素(シリコン)と窒素からなる無機化合物で、特に優れた機械的、熱的、化学的特性を持つセラミックス材料です。

特徴

高強度・高硬度
窒化ケイ素は非常に硬く、耐摩耗性に優れています。
耐熱性
高温でも機械的特性を維持できるため、耐熱材料として利用されています。
軽量性
比重が低いため、軽量かつ強靭な材料として注目されています。
耐腐食性
酸やアルカリに強く、化学的安定性が高いです。
熱膨張係数の低さ
熱膨張が少なく、熱衝撃に強い特性があります。

一般的な用途

CF-1A 高純度窒化ケイ素粉末

Test item Unit Index range Testing equipment or method
a phase % ≥93 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤1500 Atomic absorption method
ISO10058-3:2008
AI ppm ≤900
Ca ppm ≤900
N % ≥38 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.4 Gas volumetric method
GB/T 16555-2017
C % ≤0.15 High frequency infrared carbon analyzer
GB/T 16555-2017
D50 μm ≤0.75 Laser particle size analyzer
GB/T 19077-2016
O % ≤2.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017

CF-B 高純度窒化ケイ素粉末

Test item Unit Index range Testing equipment or method
a phase % ≥90 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤1800 Atomic absorption method
ISO10058-3:2008
AI ppm ≤900
Ca ppm ≤900
N % ≥37.5 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.2 Gas volumetric method
GB/T 16555-2017
C % ≤0.15 High frequency infrared carbon analyzer
GB/T 16555-2017
D50 μm ≤0.68 Laser particle size analyzer
GB/T 19077-2016
O % ≤3.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017

CF-HJ 高純度窒化ケイ素粉末

Test item Unit Index range Testing equipment or method
a phase % ≥90 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤200 Atomic absorption method
ISO10058-3:2008
AI ppm ≤200
Ca ppm ≤200
N % ≥38.5 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.2 Gas volumetric method
GB/T 16555-2017
C % ≤0.1 High frequency infrared carbon analyzer
GB/T 16555-2017
O % ≤1.4 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017
D50 μm ≤0.9 Laser particle size analyzer
GB/T 19077-2016

CF-HQ 高純度窒化ケイ素粉末

Test item Unit Index range Testing equipment or method
a phase % ≥93 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤500 Atomic absorption method
ISO10058-3:2008
AI ppm ≤300
Ca ppm ≤300
N % ≥38.5 Kjeldahl nitrogen apparatus
GB/T 16555-2017
Free Si % <0.3 Gas volumetric method
GB/T 16555-2017
C % ≤0.12 High frequency infrared carbon analyzer
GB/T 16555-2017
O % ≤1.5 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017
D50 μm ≤0.9 Laser particle size analyzer
GB/T 19077-2016

CF-K 高純度窒化ケイ素粉末

Test item Unit Index range Testing equipment or method
a phase % ≥20 X-ray diffractometer
JC/T 2342-2015
Fe ppm ≤5000 Atomic absorption method
ISO10058-3:2008
AI ppm ≤2500
Ca ppm ≤2500
N % ≥38 Kjeldahl nitrogen apparatus
GB/T 16555-2017
C % 0.15 High frequency infrared carbon analyzer
GB/T 16555-2017
O % <1.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017
D50 μm 5-10 Laser particle size analyzer
GB/T 19077-2016

CF-SN 高純度窒化ケイ素粉末

Test item Unit Index range Testing equipment or method
Fe ppm ≤5 ICP-OES
GB/T 30902-2014
AI ppm ≤5
Ca ppm ≤5
Mn ppm ≤5
Cu ppm ≤5
N % >39 Kjeldahl nitrogen apparatus
GB/T 16555-2017
C % ≤0.2 High frequency infrared carbon analyzer
GB/T 16555-2017
D50 μm 2 Laser particle size analyzer
GB/T 19077-2016
O % ≤1.0 Inertgas pulse infrared thermal conductivity method
GB/T 16555-2017